- All sections
- G - Physics
- G01B - Measuring length, thickness or similar linear dimensions; measuring angles; measuring areas; measuring irregularities of surfaces or contours
- G01B 9/02001 - Interferometers characterised by controlling or generating intrinsic radiation properties
Patent holdings for IPC class G01B 9/02001
Total number of patents in this class: 127
10-year publication summary
|
0
|
0
|
0
|
2
|
4
|
6
|
18
|
33
|
42
|
10
|
| 2015 | 2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| ASML Netherlands B.V. | 6816 |
9 |
| Seiko Epson Corporation | 18724 |
5 |
| Carl Zeiss SMT GmbH | 2646 |
5 |
| KLA Corporation | 1223 |
4 |
| Samsung Electronics Co., Ltd. | 131630 |
3 |
| The General Hospital Corporation | 4517 |
3 |
| Carl Zeiss Meditec AG | 1541 |
3 |
| Carl Zeiss Meditec, Inc. | 282 |
3 |
| NKT Photonics A/S | 215 |
3 |
| Raytheon Company | 8535 |
2 |
| NTN Corporation | 5008 |
2 |
| Omron Corporation | 6968 |
2 |
| Nippon Telegraph and Telephone Corporation | 14195 |
2 |
| ams International AG | 399 |
2 |
| CKD Corporation | 424 |
2 |
| Harbin Institute of Technology | 356 |
2 |
| IPG Photonics Corporation | 494 |
2 |
| National Institute of Metrology P.R. China | 35 |
2 |
| National Research Council of Canada | 1545 |
2 |
| Silixa Ltd. | 95 |
2 |
| Other owners | 67 |